Cypress Semiconductor CYDC128B16 Manual do Utilizador Página 1

Consulte online ou descarregue Manual do Utilizador para não Cypress Semiconductor CYDC128B16. CYDC128B16 1.8V 4k/8k/16k x 16 and 8k/16k x 8 ConsuMoBL Dual Manual do Utilizador

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CYDC128B16
1.8 V 4 K/8 K/16 K × 16 and 8 K/16 K × 8
ConsuMoBL Dual-Port Static RAM
Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134-1709 408-943-2600
Document #: 001-01638 Rev. *H Revised March 1, 2011
Features
True dual-ported memory cells which allow simultaneous
access of the same memory location
4/8/16 K × 16 and 8/16 K × 8 organization
High speed access: 40 ns
Ultra low operating power
Active: I
CC
= 15 mA (typical) at 55 ns
Active: I
CC
= 25 mA (typical) at 40 ns
Standby: I
SB3
= 2 μA (typical)
Port-independent 1.8 V, 2.5 V, and 3.0 V I/Os
Pb-free 14 × 14 × 1.4 mm 100-pin Thin Quad Flat Pack (TQFP)
Package
Full asynchronous operation
Pin select for master or slave
Expandable data bus to 32 bits with master/slave chip select
when using more than one device
On-chip arbitration logic
On-chip semaphore logic
Input read registers (IRR) and output drive registers (ODR)
INT flag for port-to-port communication
Separate upper byte and lower byte control
Commercial and industrial temperature ranges
Selection Guide for V
CC
= 1.8 V
Description
CYDC128B16
–40
CYDC128B16
–55
Unit
Port I/O Voltages (P1-P2)
1.8 V-1.8 V 1.8 V-1.8 V
Maximum Access Time 40 55 ns
Typical Operating Current 25 15 mA
Typical Standby Current for I
SB1
22μA
Typical Standby Current for I
SB3
22μA
Selection Guide for V
CC
= 2.5 V
Description
CYDC128B16
–40
CYDC128B16
–55
Unit
Port I/O Voltages (P1-P2)
2.5 V-2.5 V 2.5 V-2.5 V
Maximum Access Time 40 55 ns
Typical Operating Current 39 28 mA
Typical Standby Current for I
SB1
66μA
Typical Standby Current for I
SB3
44μA
Selection Guide for V
CC
= 3.0 V
Description
CYDC128B16
–40
CYDC128B16
–55
Unit
Port I/O Voltages (P1-P2)
3.0 V-3.0 V 3.0 V-3.0 V
Maximum Access Time 40 55 ns
Typical Operating Current 49 42 mA
Typical Standby Current for I
SB1
77μA
Typical Standby Current for I
SB3
66μA
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Página 1 - CYDC128B16

CYDC128B161.8 V 4 K/8 K/16 K × 16 and 8 K/16 K × 8 ConsuMoBL Dual-Port Static RAMCypress Semiconductor Corporation • 198 Champion Court • San Jose, C

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CYDC128B16Document #: 001-01638 Rev. *H Page 10 of 29Maximum RatingsExceeding maximum ratings may impair the useful life of thedevice. These user gu

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CYDC128B16Document #: 001-01638 Rev. *H Page 11 of 29IIXInput leakage current 1.8 V 1.8 V –1 1 –1 1 μA2.5 V 2.5 V –1 1 –1 1 μA3.0 V 3.0 V –1 1 –1 1

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CYDC128B16Document #: 001-01638 Rev. *H Page 12 of 29Electrical Characteristics for VCC = 2.5 V Over the Operating RangeParameter DescriptionCYDC128

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CYDC128B16Document #: 001-01638 Rev. *H Page 13 of 29 ]Electrical Characteristics for 3.0 V Over the Operating RangeParameter DescriptionCYDC128B16

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CYDC128B16Document #: 001-01638 Rev. *H Page 14 of 297Figure 2. AC Test Loads and WaveformsSwitching Characteristics for VCC = 1.8VOver the Operatin

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CYDC128B16Document #: 001-01638 Rev. *H Page 15 of 29 tLZWE[4, 5]R/W HIGH to Low Z 0 0 nstWDD[6]Write pulse to data delay 55 80 nstDDD[6]Write data

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CYDC128B16Document #: 001-01638 Rev. *H Page 16 of 29Switching Characteristics for VCC = 2.5 V Over the Operating RangeParameter DescriptionCYDC128B

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CYDC128B16Document #: 001-01638 Rev. *H Page 17 of 29tINRINT reset time 35 45 nsSemaphore TimingtSOPSEM flag update pulse (OE or SEM)10 15 nstSWRDSE

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CYDC128B16Document #: 001-01638 Rev. *H Page 18 of 29tHDData hold from write end 0 0 nstHZWE[3, 4]R/W LOW to high Z 15 25 nstLZWE[3, 4]R/W HIGH to l

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CYDC128B16Document #: 001-01638 Rev. *H Page 19 of 29Switching WaveformsFigure 3. Read Cycle No.1 (Either Port Address Access)[6, 7, 8]Figure 4. R

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CYDC128B16Document #: 001-01638 Rev. *H Page 2 of 29 Notes1. A0–A11 for 4k devices; A0–A12 for 8k devices; A0–A13 for 16k devices.2. BUSY is an outp

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CYDC128B16Document #: 001-01638 Rev. *H Page 20 of 29Figure 6. Write Cycle No.1: R/W Controlled Timing[11, 12, 13, 14, 15, 16]Figure 7. Write Cycl

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CYDC128B16Document #: 001-01638 Rev. *H Page 21 of 29Figure 8. Semaphore Read After Write Timing, Either Side[19, 20]Figure 9. Timing Diagram of S

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CYDC128B16Document #: 001-01638 Rev. *H Page 22 of 29Figure 10. Timing Diagram of Read with BUSY (M/S=HIGH)[23]Figure 11. Write Timing with Busy I

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CYDC128B16Document #: 001-01638 Rev. *H Page 23 of 29Figure 12. Busy Timing Diagram No.1 (CE Arbitration)Figure 13. Busy Timing Diagram No.2 (Addr

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CYDC128B16Document #: 001-01638 Rev. *H Page 24 of 29Figure 14. Interrupt Timing DiagramsNotes25. tHA depends on which enable pin (CEL or R/WL) is

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CYDC128B16Document #: 001-01638 Rev. *H Page 25 of 29Ordering Information Ordering Code Defintions8k x16 1.8V Asynchronous Dual-Port SRAMSpeed(ns)

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CYDC128B16Document #: 001-01638 Rev. *H Page 26 of 29Package DiagramFigure 15. 100-Pin Thin Plastic Quad Flat Pack (TQFP) A10051-85048 *E[+] Feedba

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CYDC128B16Document #: 001-01638 Rev. *H Page 27 of 29AcronymsAcronym DescriptionCEchip enableCMOS complementary metal oxide semiconductorI/O input/o

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CYDC128B16Document #: 001-01638 Rev. *H Page 28 of 29Document History PageDocument Title: CYDC128B16 1.8 V 4 K/8 K/16 K × 16 and 8 K/16 K × 8 ConsuM

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Document #: 001-01638 Rev. *H Revised March 1, 2011 Page 29 of 29All products and company names mentioned in this document may be the trademarks of t

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CYDC128B16Document #: 001-01638 Rev. *H Page 3 of 29ContentsFeatures ...

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Mouser Electronics Authorized Distributor Click to View Pricing, Inventory, Delivery & Lifecycle Information: Cypress Semiconductor: CYD

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CYDC128B16Document #: 001-01638 Rev. *H Page 4 of 29Pin ConfigurationsFigure 1. 100-Pin TQFP (Top View)[3]Notes3. Leave this pin unconnected. No tr

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CYDC128B16Document #: 001-01638 Rev. *H Page 5 of 29Pin DefinitionsLeft Port Right Port DescriptionCELCERChip enableR/WLR/WRRead/write enableOELOERO

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CYDC128B16Document #: 001-01638 Rev. *H Page 6 of 29Functional DescriptionThe CYDC128B16 is a low power complementary metal oxidesemiconductor (CMO

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CYDC128B16Document #: 001-01638 Rev. *H Page 7 of 29Input Read RegisterThe Input Read Register (IRR) captures the status of twoexternal input device

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CYDC128B16Document #: 001-01638 Rev. *H Page 8 of 29ArchitectureThe CYDC128B16 consists of an array of 4k, 8k, or 16k wordsof 16 dual-port RAM cell

Página 30 - CYDC128B16-55AXI

CYDC128B16Document #: 001-01638 Rev. *H Page 9 of 29Table 3. Input Read Register Operation[1, 2]SFEN CE R/W OE UB LB ADDR I/O0–I/O1I/O2–I/O15ModeHL

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