Cypress Semiconductor CY7C1386F Manual do Utilizador descarregar pdf (Página 33)

CY7C1386D, CY7C1386F

CY7C1387D, CY7C1387F

Document Number: 38-05545 Rev. *H Page 33 of 36

Acronyms Document Conventions

Units of Measure

Acronym Description

BGA ball grid array

chip enable

CMOS complementary metal oxide semiconductor

FBGA fine-pitch ball grid array

I/O input/output

JTAG Joint Test Action Group

LMBU logical multiple-bit upsets

LSB least significant bit

LSBU logical single-bit upsets

MSB most significant bit

output enable

SEL single event latch-up

SRAM static random access memory

TAP test access port

TCK test clock

TDI test data-in

TDO test data-out

TMS test mode select

TQFP thin quad flat pack

TTL transistor-transistor logic

Symbol Unit of Measure

°C degree Celsius

k kilo ohms

MHz Mega Hertz

µA micro Amperes

µs micro seconds

mA milli Amperes

mV milli Volts

mm milli meter

ms milli seconds

ns nano seconds

 ohms

% percent

pF pico Farad

ps pico seconds

VVolts

WWatts

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