Cypress Semiconductor CY7C1365C Manual do Utilizador descarregar pdf (Página 28)

CY7C1365C

Document Number: 001-74584 Rev. *C Page 28 of 30

Acronyms Document Conventions

Units of Measure

Acronym Description

CE

chip enable

CMOS complementary metal-oxide-semiconductor

EIA electronic industries alliance

FBGA fine-pitch ball grid array

I/O input/output

JEDEC joint electron devices engineering council

JTAG joint test action group

LSB least significant bit

MSB most significant bit

OE

output enable

SRAM static random access memory

TAP test access port

TCK test clock

TDI test data-in

TDO test data-out

TMS test mode select

TTL transistor-transistor logic

Symbol Unit of Measure

°C degree Celsius

MHz megahertz

µA microampere

µs microsecond

mA milliampere

mm millimeter

ms millisecond

mV millivolt

ns nanosecond

 ohm

% percent

pF picofarad

Vvolt

Wwatt

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