Cypress Semiconductor STK14C88-3 Manual do Utilizador descarregar pdf (Página 9)

STK14C88-3

Document Number: 001-50592 Rev. *A Page 9 of 17

Data Retention and Endurance

Parameter Description Min Unit

DATA

Data Retention 100 Years

Nonvolatile STORE Operations 1,000 K

Capacitance

In the following table, the capacitance parameters are listed.

[8]

Parameter Description Test Conditions Max Unit

Input Capacitance T

= 25°C, f = 1 MHz,

= 0 to 3.0 V

5pF

OUT

Output Capacitance 7 pF

Thermal Resistance

In the following table, the thermal resistance parameters are listed.

[8]

Parameter Description Test Conditions 32-SOIC 32-PDIP Unit

Thermal Resistance

(Junction to Ambient)

Test conditions follow standard test methods and

procedures for measuring thermal impedance, per

EIA / JESD51.

TBD TBD °C/W

Thermal Resistance

(Junction to Case)

TBD TBD °C/W

Figure 6. AC Test Loads

AC Test Conditions

3.3V

Output

30 pF

R1 317Ω

351Ω

Input Pulse Levels..................................................0 V to 3 V

Input Rise and Fall Times (10% - 90%)........................ <

5 ns

Input and Output Timing Reference Levels................... 1.5 V

Note

8. These parameters are guaranteed by design and are not tested.

[+] Feedback [+] Feedback

Not Recommended for New Designs

[+] Feedback

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